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News Breaks | | | | December 13, 2012 | | 06:59 EDT |  | ASTC | 1st Detect awarded U.S. patent for mass spectrometer ion trap control technology
1st Detect, a subsidiary of Astrotech, announced that the United States Patent Office has allowed the issuance of a key patent for the company's unique method to miniaturize the electrical circuitry for a mass spectrometer ion trap used for chemical analysis and detection. | |
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News For ASTC From The Last 14 Days Check below for free stories on ASTC the last two weeks. |
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