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News Breaks
December 13, 2012
06:59 EDTASTC1st Detect awarded U.S. patent for mass spectrometer ion trap control technology
1st Detect, a subsidiary of Astrotech, announced that the United States Patent Office has allowed the issuance of a key patent for the company's unique method to miniaturize the electrical circuitry for a mass spectrometer ion trap used for chemical analysis and detection.
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August 20, 2014
14:07 EDTASTCAstrotech Corporation to sell assets of Astrotech Space Operations business unit
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