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December 13, 2012
06:59 EDTASTC1st Detect awarded U.S. patent for mass spectrometer ion trap control technology
1st Detect, a subsidiary of Astrotech, announced that the United States Patent Office has allowed the issuance of a key patent for the company's unique method to miniaturize the electrical circuitry for a mass spectrometer ion trap used for chemical analysis and detection.
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January 27, 2016
09:05 EDTASTCAstrotech subsidiary receives three U.S. patents for chemical analyzers
1st Detect Corporation, a subsidiary of Astrotech Corporation, was awarded three patents by the United States Patent Office enabling the miniaturization of ion trap chemical analyzers used for detection and analysis. This increases 1st Detect's total patent count to 14 U.S. and nine international issued and ten U.S. and 16 international pending.

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